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Spice BJT geliştirilmiş Ebers-Moll model parametrelerinin bilgisayar yardımıyla bulunması

Extraction of spice BJT modified Ebers-Moll model parameters by the use of computer programs

  1. Tez No: 39110
  2. Yazar: VELİ KAYNAR
  3. Danışmanlar: PROF.DR. HAKAN KUNTMAN
  4. Tez Türü: Yüksek Lisans
  5. Konular: Bilgisayar Mühendisliği Bilimleri-Bilgisayar ve Kontrol, Computer Engineering and Computer Science and Control
  6. Anahtar Kelimeler: Belirtilmemiş.
  7. Yıl: 1993
  8. Dil: Türkçe
  9. Üniversite: İstanbul Teknik Üniversitesi
  10. Enstitü: Fen Bilimleri Enstitüsü
  11. Ana Bilim Dalı: Belirtilmemiş.
  12. Bilim Dalı: Belirtilmemiş.
  13. Sayfa Sayısı: 152

Özet

ÖZET Bu çalışmada SPICE BJT (Bipolar Joksiyonlu transistor) Geliştirilmiş Ebers-Moll modeli statik ve dinamik parametrelerin bilgisayar programları kullanılarak elde edilmeleri amaçlanmıştır. Bu amaçla bir dizi program hazırlanmıştır. Yazılan programlar iki ana grupta toplanabilir: Birinci gruptaki programlar HP 414SA yarıiletken analizörünü kullanarak bir BJT ye ilişkin ölçüm değerlerinin elde edilmesini sağlar; ikinci gruptaki programlar, elde edilen ölçüm değerlerini kullanarak istenen parametrelerin hesaplanmasını gerçekleştirir. Önce parametrelerin elde edilmeleri için sıralama yapılmış ve bu sıralama uyularak tüm parametrelerin bulunması için programlar hazırlanmıştır. önce RE emetör direncinin bulunması gerçekleşir. Sonra RC kollektör direnci elde edilmektedir. RE için IC=0 RC için IC/IB=sbt şartı altındaki ölçümler kullanılmıştır. RB baz direncini modelleyen RBO> RBM ve IRB, IC=0 şartı altındaki ölçümler kullanılarak elde edilmiştir. VJC nin elde edilmesi için VBE=sbt şartındaki çıkış özegrisi kullanılmıştır. MJC, MF ve VÂ nm elde edilmeleri için IB=sbt çıkış özeğrileri kullanılmıştır. NF, IS, NE, İSE, BF, IKF, NKF ve RCB bir grup olarak VBC=0 şartı ile elde edilen loglC-logBF değişiminden hareketle bulunmaktadırlar. RCB için, hoe ve VCE değerleri bir önceki parametrelerin hesaplanması sırasında bulunarak bu değer hesaplanmaktadır. hoe değeri hoe -hoe (I O değişiminde IC=0 daki hoe değeridir ve VCE değeri bu değişimin elde edilmesindeki VCE değeridir. Kollektör çoğaltması olayını modelleyen BV, NFF ve KFF parametreleri birlikte bulunurlar. Bu amaçla VBE=sbt çıkış özegrisi kullanılmaktadır. Statik parametreler yukarıda bahsedildiği yapıda bulunmaktadır. Dinamik parametrelerden CJC ve TF nin değerleri, QBO dinamik parametre değerinin verilmesiyle elde edilmektedir. Yukarıda kısaca anlatılan parametrelerin bulunması için sekiz ana hesaplama programı, bu programları kontrol eden bir menu programı ve her ana program için ayrı ayrı ölçüm programları hazırlanmıştır. Parametre hesabında daima minimum hata gözetilmiştir. Hazırlanan programlar çeşitli transistörlerde denenmiş ve olumlu parametre sonuçları alınarak başarı elde edilmiştir.

Özet (Çeviri)

SUMMARY EXTRACTION OF SPICE BJT MODIFIED EBERS-MOLL MODEL PARAMETERS BY THE USE OF COMPUTER PROGRAMS The aim of this study is to extract static and dynamic parametrers of SPICE BJT modified Ebers-Moll model by the use of computer programs. For any model to obtain parameters correctly effects the truth of dezign realized by a dezigner. Because of this, using computer programs is the suitest one to obtain parameters correctly. In these programs they should be extracted as possible as by using error minimization techniques. In this study that is what is always tried to do. In this work measurement datas, which are necessary to calculate parameters, are taken from HP 4145A semiconductor analyzer controlled by computer programs. Produced programs could be separated into two main groups: First group consists of programs which are used to take measurement datas of a BJT with the use of HP 414BA instrument; second group consists of programs which extract parameters using related methods with the use of measurement datas taken by first group programs. First necessary parameters are terminal resistors, which are RE emetor resistor, RC collector resistor and RB base resistor. It is necessary to obtain terminal resistors to be able to take inner terminal voltages. So, it needed to find RE emetor, RC collector and RB base terminal resistors. RB base resistor depends on base current. This effect is modelled with three parameters which are RBO, RBM, IRB. RBO is the maximum base resistor value when base current is low, RBM is the minimum base resistor value when base current is maximum. IRB is the base current where base resistor value is the half way. Well known method is used to extract RE emetor resistor value. Used measurement is VCE=VCE(IB) variation for IC=0. RE emetor resistor is extracted from this measurement. Taking the slope of that variation from the suit section gives the revers value of RE emetor resistor. Again a well known method is used to extract RC collector resistor value. Used measurement is VCE=VCE variation for IC/IB=constant. Taking the VIIslope of that variation from the suit section gives the reverse value of RC resistor. Either RC.sat or RC.Un value, can be extracted according to the value of IC/IB. If this ratio is smaller RC.sat value can be obtained. Used method, to obtain RBO, RBM and IRB values which model the variation of RB base resistor according to base current, is to use IB=IB(VBE) measurement datas for IC=0. Measurements taken at higher base current values are used in this method. Error minimization technique is used to obtain them with minimum error. The next parameter to be found is VJC BC junction built-in potential. Necessary measurement is IC=IC/d > vs log variations for IB=constant. Two measurement files are used. First one contains IC=IC(VCE) measurement datas for several IB=constant, which is used to calculate hoe=hoe variation. Second one IC=IC measurements for IE=0 and used to find first BV value. Second file is used to find BV, NFF, KFF values together, which eontins IC=IC(VCE) measurements for VBE=constant. Measurement datas are taken at high voltage values. After finding BV value with the use of related file, error minimization technique is used to find both BV and NFF values together. Then KFF is extracted using error minimization technique again. BV, NFF and KFF are all extracted using yoe variation and error minimization. After finding statik parametres as mentioned above the only needed parameter is QBO total majority base-charge to be able to find CJC and. TF dynamic parameters. QBO value is enterred to program by user. So, CJC and TF values can be found. VIIIParameter extraction methods mentioned above have been realized in eight main parameter extraction programs. Furthermore, one more program has been produced named MENU to be able to control and manage eight main programs. Related programs are executed through MENU to extract parameters whenever wanted. File name containing necessary measurements is enterred to programs or this file can be created by user. Program executes the measurement program which uses HP 4145A analyzer to take measurement datas. After taking measurement datas by this program, user can came back into parameter extraction program automatically when wants to exit. Thus, it is possible to go on parameter extraction algorithm without turning back to starting point. Each of the eight program has these features except one program that CJC and TF are found in it. Because, it does not need any measurement file. It is always tried to eliminate measurement datas containing error along with parameter extraction programs. There are three possible choises on HP 414SA analyzer's panel to decrase the amount of error while taking measurements. Three integration times are selectable. They are SHORT, MEDIUM and LONG. If short integration time is selected, measurement is taken directly when a polarity is applied. If medium integration time is selected, sixteen samples are taken for a measurement point. If long integration time is selected, 256 samples are taken for a measurement point. It has been always preferred to take measurements at long integration time. Programs, which control HP 4145A analyzer and supply measurement datas from it, have been written in BASIC language using GWBASIC. Separate measurement programs have been written for each parameter extraction programs. First section of a measurement program is SETUP section. Here, necessary arrangements are prepared to be able to take measurement datas. The next section of it consists of inputs of voltage and current start values, stop values and compliances. They are enterred by user. Voltage and current values are applied to a BJT according to enterred values. The next section consists of a cycle. Variables are changed step by step and first sent to HP 4145A instrument and then measurement is taken from it. Measurement cycle goes on until variables reach their end values or compliance values. When cycle ends, it is possible to go back to starting point. It is not turned back to setup, because it is not necessary to prepare setup again. Moreover, some report blocks have been prepared for these programs. These blocks function when variables reach their compliance values.. User can sum up the situation and decides whether it is necessary to make a measurement again or not. If a variable is current, its compliance value is voltage, similarly if a variable is IXvoltage, its compliance value is current. It is used to protect device under test being overloaded. This value is defined by user. Parameter extraction programs have been writen in PASCAL programing language and Turbo Pascal 7.0 has been used. As mentioned before, eight main programs and one control program named MENU, which controls and manages the others, have been produced. Graphic program is executable by eight main paramater extraction programs or MENU. Graphic observations are possible with graphic program. More, it is possible to execute measurement programs that realize taking measurement datas, through main execution programs. Another properties of main programs are they can be executed on them on even though they are not executed by MENU. There are many dialog sections in them to make it easier to use them and make user to be able to sum up the last situations. Thus, there are not diolog problems in them. There are things needed and things found in each extraction program. It is necessary to determine needs to be able to extract parameters. they are determined by user. First need for each main program is a file containing measurement datas. If a measurement file is exist, it is enough to input its name to program to make it being able to read measurement datas from file. If a measurement file is wanted to create, related measurement program is executed. Here a measurement file is created and it is possible to go back to extraction program. After having the measurement file, if there are necessary parameters and values, these are determined by user. First, program searches needed parameters. If finds them, wants user to decide wheter they will be used or not. If user does not want them to be used, program wants user either to input their values or to extract them. If extraction is chosen, related extraction programs are executed and needed parameters are determined. Needed parameters are defined like that and then parameter extraction algorithm is realized. Last positions can always be observed on screen. They are needs, founds, operating region, program name, file format, measurement condition, measurement program name, graphic program name. Measurement and graphic programs can be traded in another programs. The fisrt parameter extaction program is RE. RE can be extracted using this program. The only need is, as mentioned before, a file containing VCE=VCE measurement datas for IC=0. The second parameter extraction program is RC. RC collector resistor value can be extracted. It is possible to find either RC,aat or RC, Un value. Needs are a measurement file containing VCE=VCE measurement datas for several IB=constant to obtain hoe=hoe variation is determined. hoe value is the value for IC=0. There is a program named BETATPU. TPU that used by this program and helps this program during extraction. The seventh parameter extraction program is IG. BV, NFF and KFF are found, which model collector multiplication. Needs are two measurement files, RE, RC, RBO, RBM, IRB, VJC, MJC, MF and RCB parameter values. First measurement file contains IC=IC(VCB) measurement datas for IE=0 to obtain BV value. This value will be the first one for BV. Second measurement file contains IC=IC

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