TTL ve genel mos sayısal tümdevreler için bilgisayar kontrollü tümdevre test aleti
Başlık çevirisi mevcut değil.
- Tez No: 55621
- Danışmanlar: PROF.DR. HAKAN KUNTMAN
- Tez Türü: Yüksek Lisans
- Konular: Elektrik ve Elektronik Mühendisliği, Electrical and Electronics Engineering
- Anahtar Kelimeler: Belirtilmemiş.
- Yıl: 1996
- Dil: Türkçe
- Üniversite: İstanbul Teknik Üniversitesi
- Enstitü: Fen Bilimleri Enstitüsü
- Ana Bilim Dalı: Belirtilmemiş.
- Bilim Dalı: Belirtilmemiş.
- Sayfa Sayısı: 33
Özet
ÖZET Bu çalışmada, TTL ve CMOS sayısal tüm devreler için bilgisayar ile kontrol edilebilen, test kütükleri ve sonuçlan bilgisayarda saklanabilen tüm devre kontrol aleti tasarlanarak gerçeklenmiştir. Test edilecek tüm devre kütüphanede mevcutsa, yani bu tüm devre daha önceden tasarlanmışsa kullanıcı doğrudan o tüm devreye ait dosyayı çağırarak test yapabilecektir. Test edilecek tüm devre kütüphanede mevcut değilse, kullanıcı o tüm devreyi tanımlamalıdır. Tüm devre tanımlama için kullanılan program MS Windows'un bir çok kolaylığından yararlanmak için MS Visual Basic programlama dili yazılmış, tüm devre tanımlaması görsel ve olabildiğince esnek yapılmaya çalışılmıştır. Çalışmanın sunduğu bir başka olanak ise, bir tümdevre için tasarlanmış test prosedürlerinde daha sonradan değişiklik yapılabilmesi, örneğin yeni test adımları eklenebilmesidir. Kullanıcı isterse belirli bir tümdevreyi kaç defa test ettiğini ve bunlardan kaçının bozuk çıktığım öğrenebilecektir. Böylece belirli bir partide gelen tümdevrelerin kalite düzeyi ortaya çıkartılabilecektir. Test cihazının beyni olarak TMS77C82 mikroişlemcisi kullanılmaktadır. Bilgisayarla haberleşme, aldığı verileri değerlendirerek çıkış uçlarım uygun bir biçimde konumlandırma, test tümdevesinin beslenmesi için uygun seçimleri yapma, test entegeresine uygun değerleri verme, test tümdevresinden uygun değerleri okuma gibi görevleri TMS77C82 gerçekleştirir. vı
Özet (Çeviri)
SUMMARY TEST EQUIPMENT CONTROLLED BY A PC TO DIAGNOSE AN INTEGRATED CIRCUIT FROM TTL AND DIGITAL CMOS FAMILY In this thesis, a test equipment controlled by a personal computer to diagnose an integrated circuit from TTL and digital CMOS family has been designed and implemented. Digital ICs frequently are used in digital board for a long time. And sometimes it is somehow defected. If someone determine which IC is defected, one can replace with new one easily. Or someone bought digital ICs and want to know whether there are defected ICs or not. This can be known with this application. Actually, you can find digital IC tester from a electronic marketing. Difference of this application from others, user can describe any digital IC and user is not under limitation of the IC library of the tester. Only limitation of this application is pin number of the test IC and pin-place of the GND and Vcc. All test procedures and test results are stored in the PC. If an IC which will be tested is available in the library, i.e., it has been described before, a user can diagnose an IC by calling the file of this IC from the library and choosing a test method. If the IC is not available in the library, a test procedure for the IC must be described. To make easier using of PC software, MS Visual Basic was used under MS Windows. Any user who has pin description of the IC can be describe a test Vllprocedure by using menus. User also can modify a test procedure, for example can add a test step. Three clock options are available. When a test is done, one of them can be selected. These clock option are: 1-) Positive edge triggered 2-) Negative edge triggered 3-) Pulse triggered First step of describing of the test procedure is to enter the name of test IC and pin number. Second step is to enter input, output, Vcc and GND according to associated pin number. And than for all inputs, logic values are entered and for all output, logic values are entered according to input. If user desire 8 test- steps can be described for a test, i.e., 8 times enter logic value for all input and output. The last step is to add the test to library. Another features of this software is to know how many tests were done for a certain IC and how many of these are defected so that quality statistics of certain IC can be obtained. Brain of the hardware of the test equipment is TMS77C82 which is a microcontroller from Texsas Instrument TMS7000 family. To communicate with PC, to evaluate receiving data and to select Vcc and GND are some of its duty. RS232 standard is used in communication between PC and TMS77C82. One of serial ports (COMl,COM2 etc.) can be choose by user. The TMS77C82 is an 8-bit single chip microcontroller. It contains a CPU, memory (ROM, RAM), bit I/O, serial communication port, three timer, interrupts, and external bus interface logic on a single chip. vmSome features of TMS77C82 are given below: 0 8 Kbytes on - chip EPROM and 256 byte internal RAM 0 24 bi-directional and 8 output only I/O lines 0 Flexible on-chip serial port A. Asynchronous, isosynchronous, or serial port modes B. Two multi processor communication formats C. Error detection flags D. Fully software programmable( bits/char, parity, and stop bits) E. Internal or external baud rate generator F. Separate baud rate timer useable as a third timer 0 Memory- mapped ports for easy addressing 0 Eight addressing formats 0 Two external maskable interrupts, total six interrupts level and flexible interrupt handling 0 24 bi-directional and 8 output only I/O lines 0 Wide voltage operating range( 2.5 V - 6 V ), frequency range ( max. 6 MHz) 0 Two power-down modes G. Wake-up H. Halt 0 Silicon-gate CMOS technology 0 Programming using an EPROM Programmer 0 40-pin dual - inline package, 44 - pin PLCC TMS77C82 programming uses EPROM programming procedure compatible with TMS27C64 and TMS27C64 is an ordinary EPROM. Programming the TMS77C82 requires a 40 - to - 28 pin adapter socket. This programming adapter is available in Texas Instruments. But the adapter can be realised with suitable connections. In thesis the adapter was designed and realised. IXFundamental of the design are given below:. Test procedures are prepared by using the program ® The test procedures are transferred from the PC to the TMS77C82.. Vcc and GND are determined and switched to supply.. If the pin is described as an input, a bi-directional I/O pin of TMS77C82 is programmed output and according to test procedure suitable logic value is applied the pin of test circuit.. If the pin is described as an output, a bi-directional I/O pin of TMS77C82 is programmed as high impedance and the value come from test circuit is read.. After all procedure is done, results transfer the PC.. The results is evaluated.. Test number in the library is updated. If IC is defected, the number of failed IC in the library is updated The TMS77C82 has four different operating modes, allowing the optimisation of on-chip versus off chip memory for each application. These modes are Single - Chip, Peripheral Expansion, Full expansion and Microprocessor. In this application Single - Chip mode must be select since we can use all I/O lines in this mode and on-chip memory space is already enough. In this thesis, because of practical reason, max. pin number of the test IC limited with 24. The TMS77C82 has 24 bi-directional I/O lines. If max. pin number of the test IC was more than 24, many three-state - ICs and latches would be used. To avoid many ICs, max. pin number of the test IC limited with 24. Actually, one of 24 bi-directional I/O lines are used to receive serial data and 23 bi-directional I/O lines that can be used for input and output are available. 24th pin of all 24 pin IC from TTL and CMOS family is always Vcc so the IC which has 24 pin can be tested.The important point of this design is to supply test IC. Maximum I/O buffer current of TMS77C82 is ± 10 mA and this rating may be damage the device. This is why the test IC must be supplied by another supply since the test IC requires more than 10 mA (Some ICs from TTL family require more than 100mA.). In general Vcc and GND can be described at any pin but this is increase the amount of switching device that is used to supply the test IC. In practice, only 4 GND at different place ( pin ) and 7 Vcc at different place ( pin ) will be enough. Eleven logic signals must be available to control Vcc' s and GNDs switching. TMS77C82 has 8 only output lines and one of them is used as transmitter of UART of TMS77C82. As a result seven only output I/O lines can be used to control Vcc and GND switching. Three of them are assigned for Vcc control and three of them is assigned for GND control. 23 = 8 control signal can be obtained by using decoder and this number will be enough to control Vcc and GND switching. Switching device for Vcc and GND must supply minimum 100 mA current and its resistant must be approx. zero. Because relay can supply several ampere and its resistant is zero,in thesis to obtain better results relay is used as switching device. XI
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